Forschungsschwerpunkte
- Fault-Tolerant Basic Toolbox Algorithms (Sorting, MapReduce, ...)
- Fault-Tolerant Phylogenetic Tree Inferenc
- Judicious Hypergraph Partitioning
Publikationen
Exploring parallel MPI fault tolerance mechanisms for phylogenetic inference with RAxML-NG
Hübner, L.; Kozlov, A. M.; Hespe, D.; Sanders, P.; Stamatakis, A.
2021. Bioinformatics. doi:10.1093/bioinformatics/btab399
Hübner, L.; Kozlov, A. M.; Hespe, D.; Sanders, P.; Stamatakis, A.
2021. Bioinformatics. doi:10.1093/bioinformatics/btab399
Phylogenetic Analysis of SARS-CoV-2 Data Is Difficult
Morel, B.; Barbera, P.; Czech, L.; Bettisworth, B.; Hübner, L.; Lutteropp, S.; Serdari, D.; Kostaki, E.-G.; Mamais, I.; Kozlov, A. M.; Pavlidis, P.; Paraskevis, D.; Stamatakis, A.
2021. Molecular biology and evolution, 38 (5), 1777–1791. doi:10.1093/molbev/msaa314
Morel, B.; Barbera, P.; Czech, L.; Bettisworth, B.; Hübner, L.; Lutteropp, S.; Serdari, D.; Kostaki, E.-G.; Mamais, I.; Kozlov, A. M.; Pavlidis, P.; Paraskevis, D.; Stamatakis, A.
2021. Molecular biology and evolution, 38 (5), 1777–1791. doi:10.1093/molbev/msaa314
Load-Balance and Fault-Tolerance for Massively Parallel Phylogenetic Inference. Masterarbeit
Hübner, K. L.
2020. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000124310
Hübner, K. L.
2020. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000124310
Data Distribution for Phylogenetic Inference with Site Repeats via Judicious Hypergraph Partitioning
Baar, I.; Hübner, L.; Oettig, P.; Zapletal, A.; Schlag, S.; Stamatakis, A.; Morel, B.
2019. IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW), Rio de Janeiro, Brazil, Brazil, 20-24 May 2019, 175–184, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IPDPSW.2019.00038
Baar, I.; Hübner, L.; Oettig, P.; Zapletal, A.; Schlag, S.; Stamatakis, A.; Morel, B.
2019. IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW), Rio de Janeiro, Brazil, Brazil, 20-24 May 2019, 175–184, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IPDPSW.2019.00038